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Volumn 40, Issue 7, 2006, Pages 803-807

Negative capacitance (impedance of the inductive type) of silicon p +-n junctions irradiated with fast electrons

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Indexed keywords


EID: 33745622407     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063782606070128     Document Type: Article
Times cited : (15)

References (34)
  • 3
    • 33745624524 scopus 로고
    • Longman Sci. Tech., Burnt Mill; Mir, Moscow
    • K. F. Ibrahim, Television Receivers (Longman Sci. Tech., Burnt Mill, 1992; Mir, Moscow, 2000).
    • (1992) Television Receivers
    • Ibrahim, K.F.1
  • 12
    • 0000544293 scopus 로고    scopus 로고
    • [Semiconductors 30, 340 (1996)].
    • (1996) Semiconductors , vol.30 , pp. 340
  • 32
    • 0004101812 scopus 로고
    • Point Defects in Semiconductors, Ed. by M. Cardona (Springer, Berlin; Mir, Moscow)
    • J. Bourgoin and M. Lannoo, Point Defects in Semiconductors, Vol. 2: Experimental Aspects, Ed. by M. Cardona (Springer, Berlin, 1983; Mir, Moscow, 1985).
    • (1983) Experimental Aspects , vol.2
    • Bourgoin, J.1    Lannoo, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.