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Volumn 85, Issue 2, 2004, Pages 302-304

Low-frequency negative capacitance effect in systems of metallic nanoparticles embedded in dielectric matrix

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; DIELECTRIC MATERIALS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; INTERFACES (MATERIALS); SEMICONDUCTING GALLIUM; SEMICONDUCTOR MATERIALS; SILICA; WETTING;

EID: 3242885930     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1772872     Document Type: Article
Times cited : (51)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.