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Volumn 88, Issue 20, 2006, Pages

Room temperature interactions of water vapor with HfO 2 films on Si

Author keywords

[No Author keywords available]

Indexed keywords

NUCLEAR REACTION ANALYSIS; OXYGENOUS SPECIES; WATER VAPOR;

EID: 33646891952     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2203944     Document Type: Article
Times cited : (26)

References (19)
  • 1
    • 33646870197 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, Semiconductor Industry Association
    • International Technology Roadmap for Semiconductors, Semiconductor Industry Association, 2005; available on-line at http://public.itrs.net
    • (2005)
  • 2
    • 84858901667 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, Semiconductor Industry Association, 2005; available on-line at http://public.itrs.net
    • (2005)
  • 3
    • 3042715207 scopus 로고    scopus 로고
    • edited by M.Houssa (Institute of Physics, London
    • High- κ Gate Dielectrics, edited by, M. Houssa, (Institute of Physics, London, 2004).
    • (2004) High- κ Gate Dielectrics


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.