Defect analysis in crystals using x-ray topography

Microscopy Research and Technique

Volumn 69, Issue 5, 2006, Pages 343-358

  Raghothamachar, Balaji ^a   Dhanaraj, Govindhan ^a   Bai, Jie ^a   Dudley, Michael ^a  

^a STONY BROOK UNIVERSITY   (United States)

Author keywords

Contrast; Direct dislocation image; Dislocations; Dynamical dislocation image; Precipitates inclusions; Synchrotron X ray topography; X ray topography

Indexed keywords

DISLOCATIONS (CRYSTALS); SINGLE CRYSTALS;

CONTRAST; DEFECT ANALYSIS; DIRECT DISLOCATION IMAGE; DISLOCATION; DYNAMICAL DISLOCATION IMAGE; NONDESTRUCTIVE METHODS; PRECIPITATE/INCLUSION; SYNCHROTRON X-RAY TOPOGRAPHY; X-RAY TOPOGRAPHY;

TOPOGRAPHY;

CADMIUM; GALLIUM; GALLIUM NITRIDE; SILICON; TELLURIUM; UNCLASSIFIED DRUG; ZINC;

CRYSTAL STRUCTURE; DYNAMICS; PRECIPITATION; PRIORITY JOURNAL; REVIEW; SIMULATION; SYNCHROTRON RADIATION; TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY TOPOGRAPHY;

EID: 33646764203     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20290     Document Type: Review

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