The contrast of inclusions compared with that of micropipes in back-reflection synchrotron white-beam topographs of SiC

Journal of Applied Crystallography

Volumn 37, Issue 2, 2004, Pages 200-203

  Vetter, W M ^a   Dudley, M ^a  

^a Stony Brook University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; SILICON;

ARTICLE; COMPUTER SIMULATION; ELASTICITY; IMAGE QUALITY; PHOTOLUMINESCENCE; REPRODUCIBILITY; SYNCHROTRON RADIATION; TOPOGRAPHY; X RAY ANALYSIS;

EID: 3543093377     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803028553     Document Type: Article

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