Contrast mechanism in superscrew dislocation images on synchrotron back-reflection topographs

Materials Research Society Symposium - Proceedings

Volumn 524, Issue , 1998, Pages 71-76

  Huang, X R ^a   Dudley, M ^a   Vetter, W M ^a   Huang, W ^a   Wang, S ^a   Carter Jr , C H ^a  

^a STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE REFLECTION; IMAGE ANALYSIS; KINEMATICS; MATHEMATICAL MODELS; STRAIN; SYNCHROTRON RADIATION; VECTORS; X RAY ANALYSIS;

BRAGG REFLECTION; BURGERS VECTOR; SYNCHROTRON WHITE BEAM X RAY TOPOGRAPHY (SWBXT);

SILICON CARBIDE;

EID: 0031617710     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-524-71     Document Type: Conference Paper

References (11)