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Volumn 24, Issue 3, 2006, Pages 694-699

Microstructure investigations of indium tin oxide films cosputtered with zinc oxide at room temperature

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MAGNETRON SPUTTERING; MICROSTRUCTURE; SURFACE ROUGHNESS; X RAY DIFFRACTION; ZINC OXIDE;

EID: 33646540131     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2194030     Document Type: Article
Times cited : (17)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.