Corrigendum to "Criteria for ITO (indium-tin-oxide) thin film as the bottom electrode of an organic light emitting diode" [Thin Solid Films 411 (2002) 12-16] (DOI:10.1016/S0040-6090(02)00165-7);Criteria for ITO (indium-tin-oxide) thin film as the bottom electrode of an organic light emitting diode

Thin Solid Films

Volumn 411, Issue 1, 2002, Pages 12-16

  Tak, Yoon Heung ^a   Kim, Ki Beom ^a   Park, Hyoung Guen ^a   Lee, Kwang Ho ^b   Lee, Jong Ram ^b  

^a LG Electronics Inc   (South Korea)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Indium tin oxide (ITO); Leakage current; Organic light emitting diode (OLED); Surface roughness

Indexed keywords

ELECTRODES; FLAT PANEL DISPLAYS; INDIUM COMPOUNDS; INTERFACES (MATERIALS); LEAKAGE CURRENTS; LIGHT EMITTING DIODES; LIQUID CRYSTAL DISPLAYS; PLASMA DISPLAY DEVICES; SURFACE ROUGHNESS; SURFACES;

BOTTOM ELECTRODES;

THIN FILMS;

EID: 0037157426     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.12.032     Document Type: Erratum

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