Towards atomic force microscopy up to 100 MHz

Review of Scientific Instruments

Volumn 73, Issue 6, 2002, Pages 2317-

  Kawakatsu, H ^a   Kawai, S ^a   Saya, D ^a   Nagashio, M ^a   Kobayashi, D ^a   Toshiyoshi, H ^a   Fujita, H ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

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EID: 0036608995     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1480459     Document Type: Article

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