Impurity distributions in barrier anodic films on aluminium: A GDOES depth profiling study

Electrochimica Acta

Volumn 44, Issue 13, 1999, Pages 2297-2306

  Shimizu, K ^a   Brown, G M ^a   Habazaki, H ^b   Kobayashi, K ^a   Skeldon, P ^c   Thompson, G E ^c   Wood, G C ^c  

^a KEIO UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Alumina; Aluminium; Analysis; Anodizing; GDOES

Indexed keywords

ALUMINUM; IMPURITIES; ION BEAMS; ION BOMBARDMENT; METALLIC FILMS; SECONDARY ION MASS SPECTROMETRY; SPUTTERING;

ANODIC FILMS; DEPTH PROFILING; GLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY (GDOES);

ANODIC OXIDATION;

EID: 0032715750     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(98)00355-7     Document Type: Article

References (32)

1. L. Young, Anodic Oxide Films, Academic Press, New York, 1960.
2. Diggle J.W., Downie T.C., Goulding C.W. Chem. Rev. 69:1969;365.
3. Jackson N.F., Campbell D.S. Thin Solid Films. 36:1976;331.
4. Delong A., Kolarik V. J. Vac. Sci. Technol. B. 7:1989;1442.
5. Troyan P.E., Lubsanov R.B., Vorobyev G.A., Ghyngazov S.A., Lakstroem I.V., Kramor S.S. J. Vac. Sci. Technol. B. 11:1993;514.
6. Kusunoki T., Suzuki M., Sakai S., Yamaguchi J., Aida T. Jpn. J. Appl. Phys. 22:1993;L1695.
7. Amsel G., Samuel D. J. Phys. Chem. Solids. 21:1962;1707.
8. Davies J.A., Domeij B., Pringle J.P.S., Brown F. J. Electrochem. Soc. 112:1965;675.
9. Brown F., Mackintosh W.D. J. Electrochem. Soc. 120:1973;398.
10. Shimizu K., Thompson G.E., Wood G.C., Xu Y. Thin Solid Films. 88:1982;255.
11. Randall J.J. Jr., Bernard W.J. Electrochim. Acta. 20:1975;653.
12. Gomez-Aleixandre C., Montero I., Albella J. J. Appl. Electrochem. 16:1986;964.
13. Shimizu K., Thompson G.E., Wood G.C. Thin Solid Films. 77:1981;313.
14. Skeldon P., Shimizu K., Thompson G.E., Wood G.C. Thin Solid Films. 123:1985;127.
15. Skeldon P., Shimizu K., Thompson G.E., Wood G.C. Philos. Trans. R. Soc. London Ser. A: 348:1994;295.
16. Shimizu K., Kobayashi K., Thompson G.E., Wood G.C., Skeldon P. Philos. Trans. R. Soc. London Ser. A: 354:1996;213.
17. Shimizu K., Kobayashi K. J. Surf. Finish. Soc. Jpn. 46:1995;402.
18. Shimizu K., Kobayashi K., Skeldon P., Thompson G.E., Wood G.C. Corros. Sci. 38:1996;487.
19. Randall J.J. Jr., Bernard W.J., Wilkinson R.R. Electrochim. Acta. 10:1965;183.
20. Skeldon P., Shimizu K., Thompson G.E., Wood G.C. Surf. Interface Anal. 5:1983;252.
21. Takahashi H., Fujimoto K., Konno H., Nagayama M. J. Electrochem. Soc. 131:1984;1856.
22. Franzreb K., Mathieu H.J., Landolt D. Surf. Interface Anal. 23:1995;641.
23. Shimizu K., Kobayashi K., Thompson G.E., Skeldon P., Wood G.C. Philos. Mag. B. 73:1996;461.
24. K. Shimizu, G.M. Brown, H. Habazaki, K. Kobayashi, P. Skeldon, G.E. Thompson, G.C. Wood, Surf. Interface Anal., submitted for publication.
25. Skeldon P., Shimizu K., Thompson G.E., Wood G.C. Philos. Mag. B. 72:1995;391.
26. Wood G.C., Thompson G.E., Skeldon P., Shimizu K. J. Electrochem. Soc. 143:1996;74.
27. Thompson G.E., Skeldon P., Shimizu K., Wood G.C. Philos. Trans. R. Soc. London Ser. A: 350:1996;143.
28. K. Shimizu, P. Skeldon, G.E. Thompson, G.C. Wood, in preparation.
29. Morisaki S., Maeno T., Yamamuro Y. J. Surf. Finish. Soc. Jpn. 49:1998;205.
30. Payling R. Spectroscopy. 13:1998;36.
31. Mackintosh W.D., Brown F., Plattner H.H. J. Electrochem. Soc. 121:1974;1281.
32. Habazaki H., Zhou X., Shimizu K., Skeldon P., Thompson G.E., Wood G.C. Electrochim. Acta. 42:1997;2627.