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Journal of Physics Condensed Matter

Volumn 13, Issue 39, 2001, Pages 8755-8763

Polarization and self-polarization in thin PbZr1-xTixO3 (PZT) films

(6) Afanasjev, V P a Petrov, A A a Pronin, I P b Tarakanov, E A b Ju Kaptelov, E b Graul, J c

a SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI (Russian Federation)

b IOFFE INSTITUTE (Russian Federation)

c LEIBNIZ UNIVERSITY HANNOVER (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL IMPURITIES; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELD EFFECTS; HOLE TRAPS; HYSTERESIS; INTERFACES (MATERIALS); LEAD COMPOUNDS; MAGNETRON SPUTTERING; POINT DEFECTS; POLARIZATION; SPUTTER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

DIELECTRIC HYSTERESIS;

FERROELECTRIC THIN FILMS;

EID: 0035474483 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/13/39/304 Document Type: Article

Times cited : (113)

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