On the wide-energy-range tuning of x-ray photoemission electron microscope optics for the observation of the photoelectrons excited by several keV x-rays

Review of Scientific Instruments

Volumn 77, Issue 3, 2006, Pages

  Yasufuku, H ^a   Yoshikawa, H ^a   Kimura, M ^a   Vlaicu, A M ^a   Kato, M ^b   Kudo, M ^b   Fujikata, J ^c   Fukushima, S ^d  

^a National Institute for Materials Science   (Japan)

^b JEOL LTD   (Japan)

^c NEC CORPORATION   (Japan)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; IMAGING TECHNIQUES; KINETIC ENERGY; MAGNETIC FIELD EFFECTS; OPTICAL MICROSCOPY; PHOTOEMISSION; SYNCHROTRON RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY FILTERED XPEEM IMAGES; KINETIC ENERGY PHOTOELECTRONS; SOFT X-RAYS; X-RAY PHOTOEMISSION ELECTRON MICROSCOPE (XPEEM);

X RAY OPTICS;

EID: 33645844543     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2185493     Document Type: Article

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