Application of x-ray photoemission electron microscopy developed at SPring-8 BL15XU

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 892-895

  Yasufuku, H ^a   Yoshikawa, H ^a   Kimura, M ^a   Ito, K ^b   Tani, K ^b   Fukushima, S ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b RICOH COMPANY LTD   (Japan)

Author keywords

Digital versatile disc (DVD); Hard x ray; Phase change; SbTe; X ray absorption near edge structure (XANES); X ray photoemission electron microscopy (XPEEM)

Indexed keywords

DIGITAL VERSATILE DISC (DVD); HARD X-RAY; PHASE CHANGE; SBTE; X-RAY ABSORPTION NEAR-EDGE STRUCTURE (XANES); X-RAY PHOTOEMISSON ELECTRON MICROSCOPY;

ABSORPTION; AMORPHOUS FILMS; CHEMICAL ANALYSIS; CRYSTALLINE MATERIALS; ELECTRON MICROSCOPY; OPTICAL RECORDING; SEMICONDUCTING ANTIMONY; VIDEODISKS; X RAYS;

PHOTOEMISSION;

EID: 4444351725     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1893     Document Type: Conference Paper

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