PEEM and μ-NEXAFS of CuInS2-surfaces

Thin Solid Films

Volumn 431-432, Issue , 2003, Pages 307-311

  Muller K ^a   Burkov, Y ^a   Schmeisser D ^a  

^a BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

NEXAFS; Annealing process; CuInS2 films; PEEM

Indexed keywords

ANNEALING; COAGULATION; COMPOSITION; ELECTRON MICROSCOPY; ELECTRONIC STRUCTURE; GRAIN SIZE AND SHAPE; MORPHOLOGY; PHOTOEMISSION; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING FILMS; SOLAR CELLS; STOICHIOMETRY; SURFACE PROPERTIES; SYNCHROTRON RADIATION;

PHOTOEMISSION ELECTRON MICROSCOPY (PEEM);

COPPER COMPOUNDS;

EID: 0037680544     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00149-4     Document Type: Conference Paper

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