Hot luminescence from CMOS circuits: A picosecond probe of internal timing

Physica Status Solidi (B) Basic Research

Volumn 204, Issue 1, 1997, Pages 507-516

  Kash, J A ^a   Tsang, J C ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031476079     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(199711)204:1<507::AID-PSSB507>3.0.CO;2-V     Document Type: Article

References (10)

1. M. V. FISCHETTI, S. E. LAUX, and E. CRABBE, J. Appl. Phys. 78, 1058 (1995).
2. S. VILLA, A. L. LACAITA, and A. PACELLI, Phys. Rev. B 53, 10992 (1095).
3. J. BUDE, N. SANO, and A. YOSHII, Phys. Rev. B 45, 5848 (1992).
4. C. F. HAWKINS, J. M. SODEN, E. I. COLE, and E. S. SNYDER. Proc. Internat. Symp. Testing and Failure Analysis, 1990 (pp. 55 to 67).
5. S. TAM and C. HU, IEEE Trans. Electron Devices 31, 1264 (1984).
6. N. H. E. WESTE and K. ESHRAGHIAN, Principles of CMOS VLSI Design, 2nd ed., Addison-Wesley Press, Reading (Mass.) 1993.
7. J. C. TSANG and J. A. KASH, Appl. Phys. Lett. 7C, 889 (1997).
8. J. A. KASH and J. C. TSANG, IEEE Electron Device Lett. 18, 330 (1997).
9. W. G. MCMULLAN, S. CHARBONNEAU, and M. L. W. THEWALT, Rev. Sci. Instrum. 58, 1626 (1987).
10. J. A. KASH, J. C. TSANG, R. F. RIZZOLO, A. K. PATEL, and A. D. SHORE, Proc. Custom Integrated Circuits Conf., 1997.