Diagnosis and characterization of timing-related defects by time-dependent light emission

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 733-739

  Knebel, Dan ^a   Sanda, Pia ^a   McManus, Moyra ^a   Kash, J A ^a   Tsang, J C ^a   Vallett, Dave ^a   Huisman, Leendert ^a   Nigh, Phil ^a   Rizzolo, Rick ^a   Song, Peilin ^a   Motika, Franco ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; FAILURE ANALYSIS; LIGHT EMISSION; TRANSISTORS;

TIMING FAILURE;

INTEGRATED CIRCUIT TESTING;

EID: 0032305911     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)