Electron scattering due to threading edge dislocations in n-type wurtzite GaN

Journal of Applied Physics

Volumn 99, Issue 3, 2006, Pages

  You, Jeong Ho ^a   Lu, Jun Qiang ^a   Johnson, H T ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EDGE DISLOCATIONS; ELECTRON ACCEPTORS; HALL MOBILITIES;

DISLOCATIONS (CRYSTALS); ELECTROSTATICS; GALLIUM; HALL EFFECT; MATHEMATICAL MODELS; PROBABILITY DENSITY FUNCTION;

ELECTRON SCATTERING;

EID: 33645504237     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2168028     Document Type: Article

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