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Volumn 5, Issue , 2005, Pages 107-114

Transient analysis on hygroscopic swilling characterization using sequentially coupled moisture diffusion and hygroscopic stress modeling approach

Author keywords

[No Author keywords available]

Indexed keywords

HYGROSCOPIC STRESS; HYGROSCOPIC SWELLING; MOISTURE DIFFUSION;

EID: 33645076036     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE2005-81847     Document Type: Conference Paper
Times cited : (6)

References (13)
  • 1
    • 0242303593 scopus 로고    scopus 로고
    • Moisture absorption and distribusion characterisation of packaging materials-advanced treatment
    • Wong, E. H., Rajoo, R., Lim, "Moisture absorption and distribusion characterisation of packaging materials-advanced treatment," Microelectronics Reliablity, 2003 (43), pp. 2087-2096.
    • (2003) Microelectronics Reliablity , Issue.43 , pp. 2087-2096
    • Wong, E.H.1    Rajoo, R.2    Lim3
  • 2
    • 0034479822 scopus 로고    scopus 로고
    • The mechanics and impact of hygroscopic swelling of polymeric materials in electronic packaging
    • Las Vegas, NV
    • Wong, E. H., Chan, K. C., Rajoo, R., Lim, T.B., "The mechanics and impact of hygroscopic swelling of polymeric materials in electronic packaging," Proc. 50th Electron. Comp. Technol. Conf., Las Vegas, NV, 2000, pp. 576-580.
    • (2000) Proc. 50th Electron. Comp. Technol. Conf. , pp. 576-580
    • Wong, E.H.1    Chan, K.C.2    Rajoo, R.3    Lim, T.B.4
  • 3
    • 0038326650 scopus 로고    scopus 로고
    • Reliability assessment and hygroswelling modeling of FCBGA with no-flow underfill
    • Tee, T. Y., Kho, C. I., Yap, D., Toh, C., Baraton, X., Zhong, Z., "Reliability assessment and hygroswelling modeling of FCBGA with no-flow underfill" Microelectronics Reliablity, 2003, pp. 741-749.
    • (2003) Microelectronics Reliablity , pp. 741-749
    • Tee, T.Y.1    Kho, C.I.2    Yap, D.3    Toh, C.4    Baraton, X.5    Zhong, Z.6
  • 4
    • 0346781563 scopus 로고    scopus 로고
    • Integrated vapor pressure, hygroswelling, and thermo-mechanical stress modeling of QFN package during re.ow with interfacial fracture mechanics analysis
    • Tee, T.Y., Zhong, Z., "Integrated vapor pressure, hygroswelling, and thermo-mechanical stress modeling of QFN package during re.ow with interfacial fracture mechanics analysis" Microelectronics Reliability, 2004, pp.105-114
    • (2004) Microelectronics Reliability , pp. 105-114
    • Tee, T.Y.1    Zhong, Z.2
  • 6
    • 24644438851 scopus 로고    scopus 로고
    • Investigation of inner-layer dielectric (ILD) failure by hygroscopic swelling
    • May 31 - June 4, Orlando
    • Zhou, J., "Investigation of inner-layer dielectric (ILD) failure by hygroscopic swelling," IEEE 55th Electronic Components and Technology Conference (ECTC), May 31 - June 4, 2005, Orlando
    • (2005) IEEE 55th Electronic Components and Technology Conference (ECTC)
    • Zhou, J.1
  • 8
    • 0038481213 scopus 로고    scopus 로고
    • Hygroscopic swelling and sorption characteristics of epoxy molding compounds used in electronic packaging
    • Mar.
    • Ardebelli, H., Wong E.H., and Pecht, M., "Hygroscopic Swelling and Sorption Characteristics of Epoxy Molding Compounds Used in Electronic Packaging," IEEE Trans. Comp. Packag. Technol., vol. 26, pp. 206-214, Mar. 2003.
    • (2003) IEEE Trans. Comp. Packag. Technol. , vol.26 , pp. 206-214
    • Ardebelli, H.1    Wong, E.H.2    Pecht, M.3
  • 10
    • 0038088004 scopus 로고    scopus 로고
    • Dynamics of moisture diffusion, hygrothermal stresses and delamination in plastic IC packages
    • Lin, T. Y., and Tay, A.A.O., "Dynamics of Moisture Diffusion, Hygrothermal Stresses and delamination in Plastic IC Packages", ASME EEP-Vol. 19-1, Advances in Electronic Packaging, pp. 1429-1436, 1997.
    • (1997) ASME EEP-Vol. 19-1, Advances in Electronic Packaging , vol.19 , Issue.1 , pp. 1429-1436
    • Lin, T.Y.1    Tay, A.A.O.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.