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Volumn 19, Issue 2, 1997, Pages 1429-1436

Dynamics of moisture diffusion, hygrothermal stresses and delamination in plasticic packages

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0038088004     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (35)

References (15)
  • 1
    • 0342785165 scopus 로고
    • Analysis of the Package Cracking Problem with Vapor Phase Reflow Soldering and Corrective Action
    • Anjoh, I, Nishi, K, Kitano, M, and Yoshide, T, 1988 "Analysis of the Package Cracking Problem with Vapor Phase Reflow Soldering and Corrective Action" Brazing Soldering, pp48-51.
    • (1988) Brazing Soldering , pp. 48-51
    • Anjoh, I.1    Nishi, K.2    Kitano, M.3    Yoshide, T.4
  • 5
    • 0023868087 scopus 로고
    • Moisture Induced Package Cracking in Plastic Encapsulated Surface Mount Components during Solder Reflow Process
    • Lin, R., Blackshear, E., and Serisky, P., 1988, "Moisture Induced Package Cracking in Plastic Encapsulated Surface Mount Components During Solder Reflow Process," Proc.Intl. Reliability Physics Symp., pp. 83-89
    • (1988) Proc.Intl. Reliability Physics Symp. , pp. 83-89
    • Lin, R.1    Blackshear, E.2    Serisky, P.3
  • 6
    • 5844419123 scopus 로고    scopus 로고
    • A J-integral Criterion for Delamination of Bi-Material Interfaces Incorporating Hygrothermal Stresses
    • Lin, T.Y. and Tay, A. A. O , 1997, "A J-integral Criterion for Delamination of Bi-Material Interfaces Incorporating Hygrothermal Stresses", Interpack'97
    • (1997) Interpack'97
    • Lin, T.Y.1    Tay, A.A.O.2
  • 9
    • 0029227962 scopus 로고
    • A New Criterion for Packaging Integrity under Solder Reflow Conditions
    • Nguyen, L.T., Chen, K.L. and Schaefer, J., 1995, "A New Criterion for Packaging Integrity under Solder Reflow Conditions" 45th ECTC Proceedings, p478
    • (1995) 45th ECTC Proceedings , pp. 478
    • Nguyen, L.T.1    Chen, K.L.2    Schaefer, J.3
  • 10
    • 0026961879 scopus 로고
    • A New Method for Measuring Adhesion Strength of IC Molding Compounds
    • Transaction of ASME
    • Nishimura, A., Hirose, I., and Tanaka, N., 1992, "A New Method for Measuring Adhesion Strength of IC Molding Compounds" Transaction of ASME, J. of Electronic Packaging, vol 114/407
    • (1992) J. of Electronic Packaging , vol.114-407
    • Nishimura, A.1    Hirose, I.2    Tanaka, N.3
  • 11
    • 0027048160 scopus 로고
    • Analysis of Solder Crack Phenomena in LSI Plastic Packages
    • Suzuki, S. and Oota, K., 1992, "Analysis of Solder Crack Phenomena in LSI Plastic Packages, " ASME, Advances in Electronic Packaging, Vol.1, pp.343-347
    • (1992) ASME, Advances in Electronic Packaging , vol.1 , pp. 343-347
    • Suzuki, S.1    Oota, K.2
  • 12
    • 0029228589 scopus 로고
    • Measurement of IC Molding Compound Adhesion Strength and Prediction of Interface Delamination within Package
    • Tanaka, N. and Nishimura, A., 1995, "Measurement of IC Molding Compound Adhesion Strength and Prediction of Interface Delamination within Package" EEP-VOL, 10-2. Advance in Electronic Packaging ASME.
    • (1995) Advance in Electronic Packaging ASME , vol.10 EEP-VOL , Issue.2
    • Tanaka, N.1    Nishimura, A.2
  • 15
    • 0029709222 scopus 로고    scopus 로고
    • Effects of Moisture and Delamination on Cracking of Plastic IC Packages during Solder Reflow
    • Tay, A. A. O and Lin, T.Y ,1996, " Effects of Moisture and Delamination on Cracking of Plastic IC Packages during Solder Reflow" 46th Electronic Components & Technology Conference, pp. 777-782.
    • (1996) 46th Electronic Components & Technology Conference , pp. 777-782
    • Tay, A.A.O.1    Lin, T.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.