CMUTS with dual-electrode structure for improved transmit and receive performance

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 53, Issue 2, 2006, Pages 483-491

  Guldiken, Rasim O ^a,b   McLean, Jeff ^a,b,c   Degertekin, F Levent ^a,b  

^a IEEE   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^c International Mezzo Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITIVE MICROMACHINED ULTRASONIC TRANSDUCERS (CMUT); DUAL-ELECTRODE STRUCTURE; TRANSMIT ELECTRODES;

ELECTRIC CURRENTS; ELECTRODES; MATHEMATICAL MODELS; SILICON NITRIDE;

ULTRASONIC TRANSDUCERS;

DIAGNOSTIC AGENT;

ARTICLE; COMPARATIVE STUDY; COMPUTER AIDED DESIGN; ECHOGRAPHY; ELECTRIC CAPACITANCE; ELECTRONICS; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; MICROELECTRODE; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TRANSDUCER;

COMPUTER-AIDED DESIGN; ELECTRIC CAPACITANCE; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICROELECTRODES; MINIATURIZATION; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TRANSDUCERS; ULTRASONOGRAPHY;

EID: 33645068877     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2006.1593388     Document Type: Article

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