Atomic force microscopy stress sensors for studies in liquids

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1383-1385

  O'Shea, S J ^a   Welland, M E ^a   Brunt, T A ^a   Ramadan, A R ^a   Rayment, T ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001508840     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589103     Document Type: Article

References (10)

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