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Volumn 71, Issue 8, 2005, Pages
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Differential tunneling spectroscopy simulations: Imaging surface states
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Author keywords
[No Author keywords available]
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Indexed keywords
METAL;
ARTICLE;
CALCULATION;
DIFFERENTIAL TUNNELING SPECTROSCOPY;
ELECTRIC POTENTIAL;
ELECTRONICS;
IMAGE ANALYSIS;
IMAGE ENHANCEMENT;
IMAGE RECONSTRUCTION;
IMAGING SYSTEM;
MATHEMATICAL ANALYSIS;
SEMICONDUCTOR;
SIMULATION;
SPECTROSCOPY;
VACUUM;
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EID: 16344386612
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.71.085401 Document Type: Article |
Times cited : (32)
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References (27)
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