메뉴 건너뛰기




Volumn 5965, Issue , 2005, Pages

Measuring wavefront tilt using shearing interferometry

Author keywords

Interferometer; Lateral shearing; Radial shearing; Rotational shearing; Tilt measurement

Indexed keywords

LATERAL SHEARING; RADIAL SHEARING; ROTATIONAL SHEARING; TILT MEASUREMENT;

EID: 33244460296     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.625247     Document Type: Conference Paper
Times cited : (5)

References (17)
  • 1
    • 0035759062 scopus 로고    scopus 로고
    • Error separation technique for mierolithographic lesn testing with null configurations
    • S. Mack, T. Rich, J. Webb, P. Dewa, H. Schreiber, "Error separation technique for mierolithographic lesn testing with null configurations", Proc. SPIE4346, 1328-1339 (2001)
    • (2001) Proc. SPIE , vol.4346 , pp. 1328-1339
    • Mack, S.1    Rich, T.2    Webb, J.3    Dewa, P.4    Schreiber, H.5
  • 2
    • 0016892621 scopus 로고
    • Interferometric testing of smooth surfaces
    • E. Wolf Ed., Elsivier Publisher New York
    • G. Schulz, J. Schwider, "Interferometric testing of smooth surfaces", Prog. In Optics XIII, E. Wolf Ed., Elsivier Publisher New York (1976)
    • (1976) Prog. in Optics XIII
    • Schulz, G.1    Schwider, J.2
  • 3
    • 0003877515 scopus 로고
    • D. Malacara Ed., John Wiley & Sons, New York 461 ff
    • nd Ed. John Wiley & Sons, New York 461 ff. (1992)
    • (1992) nd Ed.
  • 4
    • 0029293401 scopus 로고
    • The contribution of high order Zernike modes to wavefront tilt
    • T. A. ten Brummelar, "The contribution of high order Zernike modes to wavefront tilt", Optics Communications 115 (1995) 417-424
    • (1995) Optics Communications , vol.115 , pp. 417-424
    • Ten Brummelar, T.A.1
  • 5
    • 0001090963 scopus 로고
    • Rotary shearing interferometry
    • J. D. Armitage, A. Lohmann, "Rotary Shearing Interferometry", Opt. Acta 12, 185-192 (1965)
    • (1965) Opt. Acta , vol.12 , pp. 185-192
    • Armitage, J.D.1    Lohmann, A.2
  • 7
    • 0014824199 scopus 로고
    • Interferomctric measurements of angles
    • D. Malacara, O. Harris, "Interferomctric Measurements of Angles", Applied Optics, Volume 9, Issue 7, 1630-(1970)
    • (1970) Applied Optics , vol.9 , Issue.7 , pp. 1630
    • Malacara, D.1    Harris, O.2
  • 8
    • 0000134675 scopus 로고    scopus 로고
    • A lateral shearing interferometer based on two Ronchi Gratings in series
    • H. Schreiber, J. Schwider: A lateral shearing interferometer based on two Ronchi Gratings in series, Applied Optics, Vol. 36 No. 22 (1997), 5321-5324
    • (1997) Applied Optics , vol.36 , Issue.22 , pp. 5321-5324
    • Schreiber, H.1    Schwider, J.2
  • 9
    • 0035758734 scopus 로고    scopus 로고
    • Applications of a grating shearing interferometer at 157nm
    • Optical Microlithography XIV
    • H. Schreiber, P. Dewa, M. Dunn, R. Hordin, S. Mack, B. Statt, P. Tompkins, Applications of a Grating Shearing Interferometer at 157nm, Optical Microlithography XIV, Proc SPIE, Vol 4346, (2001), 1095-1106
    • (2001) Proc SPIE , vol.4346 , pp. 1095-1106
    • Schreiber, H.1    Dewa, P.2    Dunn, M.3    Hordin, R.4    Mack, S.5    Statt, B.6    Tompkins, P.7
  • 10
    • 0036421195 scopus 로고    scopus 로고
    • A high precision 2D- Angle measurement interferometer
    • Z. Ge, M. Takeda, "A High Precision 2D- Angle Measurement Interferometer", Proc. SPIE Vol. 4778, 277-287 (2002)
    • (2002) Proc. SPIE , vol.4778 , pp. 277-287
    • Ge, Z.1    Takeda, M.2
  • 11
    • 0029181226 scopus 로고    scopus 로고
    • Technique of recording and judging the sign of tilt in one interferogram
    • K. Tenjimbayashi, "Technique of recording and judging the sign of tilt in one interferogram", Proc. SPIE Vol. 2576, 326-334
    • Proc. SPIE , vol.2576 , pp. 326-334
    • Tenjimbayashi, K.1
  • 12
    • 15744404162 scopus 로고    scopus 로고
    • Absolute measurement of tilts via fourier analysis of interferograms
    • R. W. Toland, "Absolute Measurement of Tilts via Fourier Analysis of Interferograms", Proc. SPIE Vol. 5531, 299-303, (2004)
    • (2004) Proc. SPIE , vol.5531 , pp. 299-303
    • Toland, R.W.1
  • 13
    • 84975560634 scopus 로고
    • An interferometer for precision angle measurements
    • J. Rohlin, "An Interferometer for Precision Angle Measurements", Applied Optics, Volume 2, Issue 7, 762-763 (1963)
    • (1963) Applied Optics , vol.2 , Issue.7 , pp. 762-763
    • Rohlin, J.1
  • 14
    • 0038130235 scopus 로고    scopus 로고
    • Michelson interferometer for precision angle measurement
    • M. Ikram, G. Hussain, "Michelson interferometer for precision angle measurement", Applied Optics, Volume 38, Issue 1, 113-120 (1999)
    • (1999) Applied Optics , vol.38 , Issue.1 , pp. 113-120
    • Ikram, M.1    Hussain, G.2
  • 15
    • 0344686365 scopus 로고    scopus 로고
    • High-resolution two-dimensional angle measurement technique based on fringe analysis
    • Z. Ge, M. Takeda, "High-resolution two-dimensional angle measurement technique based on fringe analysis", Applied Optics, Volume 42, Issue 34, 6859-6868 (2003)
    • (2003) Applied Optics , vol.42 , Issue.34 , pp. 6859-6868
    • Ge, Z.1    Takeda, M.2
  • 16
    • 84975612617 scopus 로고
    • Continuous lateral shearing interferometer
    • J. Schwider, "Continuous lateral shearing interferometer", Applied Optics, Vol. 23 Issue 23 Page 4403 (1984)
    • (1984) Applied Optics , vol.23 , Issue.23 , pp. 4403
    • Schwider, J.1
  • 17
    • 26444445626 scopus 로고    scopus 로고
    • Diffractive lateral shearing interferometer for phase shift mask measurement using an excimer laser source
    • J. Schwider, G. Fütterer, N. Lindlein, "Diffractive Lateral Shearing Interferometer for Phase Shift Mask Measurement Using an Excimer Laser Source", Proc. SPIE Vol. 5776, 270-276 (2005)
    • (2005) Proc. SPIE , vol.5776 , pp. 270-276
    • Schwider, J.1    Fütterer, G.2    Lindlein, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.