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Volumn 36, Issue 22, 1997, Pages 5321-5324
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Lateral shearing interferometer based on two Ronchi phase gratings in series
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Author keywords
Lateral shearing interferometry; Near IR; Phase shifting interferometry; Testing of silicon microlenses
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Indexed keywords
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EID: 0000134675
PISSN: 1559128X
EISSN: 21553165
Source Type: Journal
DOI: 10.1364/AO.36.005321 Document Type: Article |
Times cited : (84)
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References (9)
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