Absolute measurement of tilts via Fourier analysis of interferograms

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5531, Issue , 2004, Pages 299-303

  Toland, Ronald W ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FRINGE ANALYSIS; INTERACTIVE DATA LANGUAGE (IDL); PHASE SHIFT INTERFEROMETRY (PSI); VECTOR METROLOGY;

ALGORITHMS; CAMERAS; CHARGE COUPLED DEVICES; COMPUTER SOFTWARE; FOURIER TRANSFORMS; INTERFEROMETERS; INTERFEROMETRY; INTERPOLATION;

OPTICAL SYSTEMS;

EID: 15744404162     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.559810     Document Type: Conference Paper

References (10)

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9. th ed., pp. 320-338, Cambridge University Press, 2002
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