High-resolution two-dimensional angle measurement technique based on fringe analysis

Applied Optics

Volumn 42, Issue 34, 2003, Pages 6859-6868

  Ge, Zongtao ^a   Takeda, Mitsuo ^b  

^a Fuji Photo Optical Co Ltd   (Japan)

^b UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; COMPUTER SIMULATION; FAST FOURIER TRANSFORMS; INTERFEROMETERS; LENSES; MIRRORS; PHASE SHIFT; PROFILOMETRY;

ANGULAR DISPLACEMENT; AUTOCOLLIMATOR METHOD; FRINGE ANALYSIS;

OPTICAL SYSTEMS;

EID: 0344686365     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.006859     Document Type: Article

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