Single-event mitigation in combinational logic using targeted data path hardening

IEEE Transactions on Nuclear Science

Volumn 52, Issue 6, 2005, Pages 2516-2523

  Srinivasan, V ^a,b   Sternberg, A L ^a,b   Duncan, A R ^a,c   Robinson, W H ^a,b   Bhuva, B L ^a,b   Massengill, L W ^a,b  

^a IEEE   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

Arithmetic Logic Unit (ALU); Combinational logic; Radiation hardening; Soft errors

Indexed keywords

ARITHMETIC LOGIC UNIT (ALU); PROPAGATION PATHS; SINGLE-EVENT (SE); SOFT ERRORS;

DATA PROCESSING; MOTION PLANNING; RADIATION HARDENING; UPSETTING (FORMING);

COMBINATORIAL CIRCUITS;

EID: 33144473637     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.860714     Document Type: Conference Paper

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