Synchrotron X-ray microfluorescence and microspectroscopy: Application and perspectives in materials science

Oil and Gas Science and Technology

Volumn 60, Issue 6, 2005, Pages 979-993

  Bohic, S ^a   Simionovici, A ^a,b   Biquard, X ^c   Martinez Criado, G ^a   Susini, J ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITÉ LYON 1   (France)

^c CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MATERIAL CHARACTERIZATION; X RAY MICROFLUORESCENCE;

CHARACTERIZATION; MATERIALS SCIENCE; SYNCHROTRONS; TRACE ELEMENTS; X RAY OPTICS;

X RAY SPECTROSCOPY;

CHARACTERIZATION; MATERIALS SCIENCE; SYNCHROTRONS; TRACE ELEMENTS; X RAY OPTICS; X RAY SPECTROSCOPY;

SCIENCE IN GENERAL;

EID: 33144460630     PISSN: 12944475     EISSN: None     Source Type: Journal    
DOI: 10.2516/ogst:2005069     Document Type: Article

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