Dislocation density analysis in single grains of steel by X-ray scanning microdiffraction

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 1245-1248

  Castelnau, O ^a   Drakopoulos, M ^b   Schroer, C ^c   Snigireva, I ^b   Snigirev, A ^b   Ungar, T ^d  

^a UNIVERSITÉ PARIS 13   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c RWTH AACHEN UNIVERSITY   (Germany)

^d EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

Diffraction line broadening; Dislocation density; Single grain; X ray micro diffraction

Indexed keywords

EID: 0000928225     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00638-6     Document Type: Article

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