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Volumn 104, Issue , 2003, Pages 547-550

STXM imaging with a configured detector

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; COMPUTER CONTROL SYSTEMS; FOURIER TRANSFORMS; IMAGE ANALYSIS; MICROSCOPIC EXAMINATION; RADIATION DETECTORS; READOUT SYSTEMS; SYNCHRONIZATION; X RAY MICROSCOPES;

EID: 0038363753     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20030141     Document Type: Conference Paper
Times cited : (28)

References (12)
  • 5
    • 0010395487 scopus 로고
    • X-ray imaging with a configured detector
    • V.V. Aristov and A.I. Erko Eds.(Bogorodski Pechatnik, Chernogolovka, 1994)
    • Morrison G.R., "X-ray imaging with a configured detector", X-ray Microscopy IV. Chernogolovka 1993 V.V. Aristov and A.I. Erko Eds.(Bogorodski Pechatnik, Chernogolovka, 1994) pp. 479-484
    • (1993) X-ray Microscopy IV. Chernogolovka , pp. 479-484
    • Morrison, G.R.1
  • 6
    • 0042447830 scopus 로고    scopus 로고
    • Differential phase contrast x-ray microscopy
    • Würzburg; J. Thieme, G. Schmahl, D. Rudolph, and E. Umbach Eds. (Springer; Berlin, 1998)
    • Morrison G.R. and Niemann B., "Differential phase contrast x-ray microscopy", X-ray Microscopy and Spectromicroscopy, Würzburg 1996, J. Thieme, G. Schmahl, D. Rudolph, and E. Umbach Eds. (Springer; Berlin, 1998) pp. 85-94
    • (1996) X-Ray Microscopy and Spectromicroscopy , pp. 85-94
    • Morrison, G.R.1    Niemann, B.2
  • 7
    • 0032225270 scopus 로고    scopus 로고
    • The scanning microscopy end-station at the ESRF X-ray microscopy beamline
    • X-Ray Microfocusing: Applications and Techniques, I. McNulty Ed.
    • Barrett R., Kaulich B., Oestreich S., Susini J., "The scanning microscopy end-station at the ESRF X-ray microscopy beamline", X-Ray Microfocusing: Applications and Techniques, I. McNulty Ed. Proc. SPIE 3449 (1998) 80-90
    • (1998) Proc. SPIE , vol.3449 , pp. 80-90
    • Barrett, R.1    Kaulich, B.2    Oestreich, S.3    Susini, J.4
  • 8
    • 0038261979 scopus 로고    scopus 로고
    • Configured detector system for STXM imaging
    • 6th International Conference on X-ray Microscopy, Berkeley 1999, W. Meyer-Ilse, T. Warwick, D. Attwood Eds.
    • Eaton W.J., Morrison G.R., Waltham N.R., "Configured detector system for STXM imaging", 6th International Conference on X-ray Microscopy, Berkeley 1999, W. Meyer-Ilse, T. Warwick, D. Attwood Eds. AIP Conference Proceedings 507 (2000) 452-457
    • (2000) AIP Conference Proceedings , vol.507 , pp. 452-457
    • Eaton, W.J.1    Morrison, G.R.2    Waltham, N.R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.