-
1
-
-
0028530959
-
-
Schmahl G., Rudolph D., Schneider G., Guttmann P., Niemann B., Optik 97 (1994) 181-182
-
(1994)
Optik
, vol.97
, pp. 181-182
-
-
Schmahl, G.1
Rudolph, D.2
Schneider, G.3
Guttmann, P.4
Niemann, B.5
-
2
-
-
0001045623
-
-
Davis T.J.; Gureyev T., Gao D., Stevenson A.W., Wilkins S.W., Phys. Rev. Lett. 74 (1995) 3173-3176
-
(1995)
Phys. Rev. Lett.
, vol.74
, pp. 3173-3176
-
-
Davis, T.J.1
Gureyev, T.2
Gao, D.3
Stevenson, A.W.4
Wilkins, S.W.5
-
3
-
-
0033531394
-
-
Gureyev T., Raven C., Snigirev, A., Snigireva, Wilkins S.W., J. Phys. D 32 (1999) 563-567
-
(1999)
J. Phys. D
, vol.32
, pp. 563-567
-
-
Gureyev, T.1
Raven, C.2
Snigirev, A.3
Snigireva4
Wilkins, S.W.5
-
4
-
-
0035794383
-
-
Wilhein T., Kaulich B., Di Fabrizio E., Romanato F., Cabrini S., Susini J., Appl. Phys. Lett. 78 (2001) 2082-2084
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 2082-2084
-
-
Wilhein, T.1
Kaulich, B.2
Di Fabrizio, E.3
Romanato, F.4
Cabrini, S.5
Susini, J.6
-
5
-
-
0010395487
-
X-ray imaging with a configured detector
-
V.V. Aristov and A.I. Erko Eds.(Bogorodski Pechatnik, Chernogolovka, 1994)
-
Morrison G.R., "X-ray imaging with a configured detector", X-ray Microscopy IV. Chernogolovka 1993 V.V. Aristov and A.I. Erko Eds.(Bogorodski Pechatnik, Chernogolovka, 1994) pp. 479-484
-
(1993)
X-ray Microscopy IV. Chernogolovka
, pp. 479-484
-
-
Morrison, G.R.1
-
6
-
-
0042447830
-
Differential phase contrast x-ray microscopy
-
Würzburg; J. Thieme, G. Schmahl, D. Rudolph, and E. Umbach Eds. (Springer; Berlin, 1998)
-
Morrison G.R. and Niemann B., "Differential phase contrast x-ray microscopy", X-ray Microscopy and Spectromicroscopy, Würzburg 1996, J. Thieme, G. Schmahl, D. Rudolph, and E. Umbach Eds. (Springer; Berlin, 1998) pp. 85-94
-
(1996)
X-Ray Microscopy and Spectromicroscopy
, pp. 85-94
-
-
Morrison, G.R.1
Niemann, B.2
-
7
-
-
0032225270
-
The scanning microscopy end-station at the ESRF X-ray microscopy beamline
-
X-Ray Microfocusing: Applications and Techniques, I. McNulty Ed.
-
Barrett R., Kaulich B., Oestreich S., Susini J., "The scanning microscopy end-station at the ESRF X-ray microscopy beamline", X-Ray Microfocusing: Applications and Techniques, I. McNulty Ed. Proc. SPIE 3449 (1998) 80-90
-
(1998)
Proc. SPIE
, vol.3449
, pp. 80-90
-
-
Barrett, R.1
Kaulich, B.2
Oestreich, S.3
Susini, J.4
-
8
-
-
0038261979
-
Configured detector system for STXM imaging
-
6th International Conference on X-ray Microscopy, Berkeley 1999, W. Meyer-Ilse, T. Warwick, D. Attwood Eds.
-
Eaton W.J., Morrison G.R., Waltham N.R., "Configured detector system for STXM imaging", 6th International Conference on X-ray Microscopy, Berkeley 1999, W. Meyer-Ilse, T. Warwick, D. Attwood Eds. AIP Conference Proceedings 507 (2000) 452-457
-
(2000)
AIP Conference Proceedings
, vol.507
, pp. 452-457
-
-
Eaton, W.J.1
Morrison, G.R.2
Waltham, N.R.3
-
9
-
-
84975543317
-
-
Acosta E., Bará S., Rama M.A., Ríos S., Opt. Lett. 20 (1995) 1083-1085
-
(1995)
Opt. Lett.
, vol.20
, pp. 1083-1085
-
-
Acosta, E.1
Bará, S.2
Rama, M.A.3
Ríos, S.4
|