Differential interference contrast x-ray microscopy with submicron resolution

Applied Physics Letters

Volumn 78, Issue 14, 2001, Pages 2082-2084

  Wilhein, Thomas ^a   Kaulich, Burkhard ^b   Di Fabrizio, Enzo ^b   Romanato, Fillipo ^b   Cabrini, Stefano ^c   Susini, Jean ^d  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b SINCROTRONE TRIESTE   (Italy)

^c Ist di Elettron dello Stato Solido   (Italy)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035794383     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1360776     Document Type: Article

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