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Applied Surface Science

Volumn 252, Issue 9, 2006, Pages 3188-3193

Positron lifetime and microstructural characterisation of a-Si:H deposited by low temperature HW-CVD on paper substrates

(4) Harting M a Britton, D T a Knoesen, D b Egger, W c

a UNIVERSITY OF CAPE TOWN (South Africa)

b UNIVERSITY OF THE WESTERN CAPE (South Africa)

c BUNDESWEHR UNIVERSITY MUNICH (Germany)

Author keywords

Cheap paper substrate; Hydrogenated amorphous silicon; Positron lifetime spectroscopy

Indexed keywords

CHEMICAL BONDS; CHEMICAL VAPOR DEPOSITION; HYDROGENATION; METALLIZING; MICROSTRUCTURE; X RAY DIFFRACTION ANALYSIS;

CHEAP PAPER SUBSTRATE; HYDROGENATED AMORPHOUS SILICON; POSITRON LIFETIME SPECTROSCOPY;

AMORPHOUS SILICON;

EID: 32644481209 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2005.08.068 Document Type: Article

Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.