3-D Measurement of deformation microstructure in ai(0.2%)mg using submicron resolution white x-ray microbeams

Materials Research Society Symposium - Proceedings

Volumn 590, Issue , 2000, Pages 247-252

  Larson, B C ^a   Tamura, N ^a   Chung, J S ^a   Ice, G E ^a   Budai, J D ^b   Tischler, J Z ^b   Yang, W ^b   Weiland, H ^b   Lowe, W P ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b HOWARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DEFORMATION; MIRRORS; STRAIN; X RAY CRYSTALLOGRAPHY;

KIRKPATRICK-BAEZ MIRRORS; SUBMICRON-RESOLUTION WHITE X-RAY MICROBEAMS;

ALUMINUM ALLOYS;

EID: 0033701435     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)

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