Evaluation of domain boundary of piezo/ferroelectric material by ultrasonic atomic force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 5 B, 2004, Pages 2907-2913

  Tsuji, Toshihiro ^a,b   Ogiso, Hisato ^a   Akedo, Jun ^a   Saito, Shigeru ^b   Fukuda, Kenji ^b   Yamanaka, Kazushi ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Domain boundary; Elasticity; Lead zirconate titanate; Mechanical property; Piezoresponse force microscopy; Stiffness; Ultrasonic atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTICITY; LEAD COMPOUNDS; PHOTODIODES; STIFFNESS; ULTRASONIC VELOCITY;

DOMAIN BOUNDARY; LEAD ZIRCONATE TITANATE; ULTRASONIC ATOMIC FORCE MICROSCOPY;

FERROELECTRIC CERAMICS;

EID: 3242744581     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.2907     Document Type: Conference Paper

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