Cantilever dynamics in ultrasonic force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 5 B, 2002, Pages 3545-3546

  Matsuda, Osamu ^a   Terada, Takuya ^a   Inagaki, Katsuhiko ^a   Wright, Oliver B ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy; Cantilever; Finite difference; Ultrasonic force microscopy; Vibration

Indexed keywords

ATOMIC FORCE MICROSCOPY; DISTANCE MEASUREMENT; ELASTIC MODULI; ELASTICITY; FINITE DIFFERENCE METHOD; FORCE MEASUREMENT; INTERFEROMETERS; MATHEMATICAL MODELS; NATURAL FREQUENCIES; SINGLE CRYSTALS; VIBRATIONS (MECHANICAL);

ULTRASONIC FORCE MICROSCOPY; ULTRASONIC VIBRATION;

ULTRASONIC APPLICATIONS;

EID: 0036578139     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.3545     Document Type: Article

References (13)