Nanoscale imaging of elastic and piezoelectric properties of nanocrystalline lead calcium titanate

Surface Science

Volumn 532-535, Issue , 2003, Pages 450-455

  Kopycinska, Malgorzata ^a   Ziebert, Carlos ^b   Schmitt, Heinz ^b   Rabe, Ute ^a   Hirsekorn, Sigrun ^a   Arnold, Walter ^a  

^a Fraunhofer Inst Non Destr Testing   (Germany)

^b SAARLAND UNIVERSITY   (Germany)

Author keywords

Amorphous thin films; Atomic force microscopy; Piezoelectric effect; Polycrystalline thin films

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; IMAGING SYSTEMS; NANOSTRUCTURED MATERIALS; PIEZOELECTRIC MATERIALS; THIN FILMS;

NANOSCALE IMAGING;

LEAD COMPOUNDS;

EID: 0038183980     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00099-2     Document Type: Conference Paper

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