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Japanese Journal of Applied Physics, Part 2: Letters

Volumn 44, Issue 46-49, 2005, Pages

Electronic structure in valence band of Nd-substituted Bi 4Ti3O12 single crystal probed by soft-X-ray emission spectroscopy

(8) Higuchl, Tohru a Noguchi, Yuji b,c Goto, Takashi b Miyayama, Masaru b Shin, Shik d,e Kaneda, Kazuhiro a Hattori, Takeshi a Tsukamoto, Takeyo a

a TOKYO UNIVERSITY OF SCIENCE (Japan)

b UNIVERSITY OF TOKYO (Japan)

c JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

d UNIVERSITY OF TOKYO (Japan)

e RIKEN (Japan)

Author keywords

Band calculation; Electronic structure; Nd substituted Bi4Ti3O12 (Bi 4 xNdxTi3O12) single crystal; Soft X ray emission spectroscopy (SXES); Ti O hybridization effect

Indexed keywords

BAND STRUCTURE; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; NEODYMIUM; SINGLE CRYSTALS;

BAND CALCULATION; BI-O HYBRIDIZATION; VALENCE BANDS;

BISMUTH;

EID: 31944438345 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.44.L1491 Document Type: Article

Times cited : (7)

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