Rietveld analysis of intensity data taken on the TOF neutron powder diffractometer VEGA

Physica B: Condensed Matter

Volumn 234-236, Issue , 1997, Pages 1093-1095

  Ohta, T ^a   Izumi, F ^a   Oikawa, K ^b   Kamiyama, T ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Powder diffraction; Rietveld refinement; Time of flight

Indexed keywords

COMPUTATIONAL METHODS; FUNCTIONS; NEUTRON DIFFRACTION; OPTIMIZATION;

PARTIAL PROFILE RELAXATION; POWDER DIFFRACTION; RIETVELD ANALYSIS; SOFTWARE PACKAGE RIETAN 96T;

DIFFRACTOMETERS;

EID: 0031548638     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(97)00032-X     Document Type: Article

References (5)

1. T. Kamiyama et al., Physica B 213&214 (1995) 875.
2. F. Izumi et al., J. Appl. Crystallogr. 20 (1987) 411.
3. F. Izumi, in: The Rietveld Method, ed. R.A. Young (Oxford University Press, Oxford, 1993) ch. 13.
4. I. Cole and C.G. Windsor, Nucl. Instr. and Meth. 171 (1980) 107.
5. H. Mizoguchi et al., to be submitted.