Integration of non-classical faults in standard March tests

Proceedings - International Workshop on Memory Technology, Design and Testing, MTDT 1998

Volumn 1998-August, Issue , 1998, Pages 91-96

  Niggemeyer, D ^a   Redeker, M ^a   Otterstedt, J ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; DEGREES OF FREEDOM (MECHANICS); INTEGRATED CIRCUIT TESTING;

DETECTION FEATURES; MARCH TEST ALGORITHMS; MEMORY ORGANIZATIONS; SEQUENCE GENERATORS; SILICON AREA; TARGET FAULTS; TEST ALGORITHMS; TEST APPLICATION TIME;

FAULT DETECTION;

EID: 85007454746     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.1998.705953     Document Type: Conference Paper

References (12)

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