High-resolution nanowire atomic force microscope probe grown by a field-emission induced process

Applied Physics Letters

Volumn 84, Issue 25, 2004, Pages 5207-5209

  Tay, A B H ^a   Thong, J T L ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; CRYSTAL GROWTH; ELECTROCHEMISTRY; ETCHING; IMAGING SYSTEMS; OPTICAL RESOLVING POWER; SCANNING ELECTRON MICROSCOPY; STIFFNESS; TUNGSTEN; VACUUM APPLICATIONS;

CANTILEVER CLAMPING ARRANGEMENT; FIELD EMISSIONS; NANOWIRE PROBES;

NANOSTRUCTURED MATERIALS;

EID: 3142691089     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1765202     Document Type: Article

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