Enhancing reliability of RTL controller-datapath circuits via invariant-based concurrent test

IEEE Transactions on Reliability

Volumn 53, Issue 2, 2004, Pages 269-278

  Makris, Yiogros ^a   Bayraktaroglu, Ismet ^b   Orailoglu, Alex ^c  

^a Yale University   (United States)

^b SUN MICROSYSTEMS   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMBINATORIAL CIRCUITS; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; INVARIANCE; SEQUENTIAL CIRCUITS;

ALGORITHMIC INVARIANCE; CONCURRENT TEST; CONTROLLER DATAPATH; PATH INVARIANCE;

RELIABILITY THEORY;

EID: 3142660360     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2004.829175     Document Type: Article

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