DFT guidance through RTL test justification and propagation analysis

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 668-677

  Makris, Yiorgos ^a   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION (ATPG); TESTABILITY ANALYSIS;

ALGORITHMS; DESIGN FOR TESTABILITY;

SEMICONDUCTOR DEVICE TESTING;

EID: 0032318129     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743211     Document Type: Conference Paper

References (15)