Concurrent test for digital linear systems

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 20, Issue 9, 2001, Pages 1132-1142

  Bayraktaroglu, Ismet ^a,b   Orailoglu, Alex ^a,b  

^a IEEE   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Accumulation based invariants; Concurrent test; Digital linear systems; Online test

Indexed keywords

DIGITAL SYSTEMS; ONLINE TESTING;

COMPUTATIONAL METHODS; COST EFFECTIVENESS; DIGITAL SIGNAL PROCESSING; ERROR DETECTION; LINEAR SYSTEMS; SIGNAL TO NOISE RATIO;

INTEGRATED CIRCUIT TESTING;

EID: 0035441028     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.945308     Document Type: Article

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