Parameterized VHDL library for on-line testing

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 479-488

  Stroud, C ^a   Ding, M ^a   Seshadri, S ^a   Kim, I ^a   Roy, S ^a   Wu, S ^a   Karri, R ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; ONLINE SYSTEMS; SEMICONDUCTOR DEVICE MODELS;

CONCURRENT FAULT DETECTION CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0031340066     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)