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Volumn 47, Issue 7, 1999, Pages 2259-2268

Measurements of grain boundary mobility during recrystallization of a single-phase aluminium alloy

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN GROWTH; RECRYSTALLIZATION (METALLURGY); SCANNING ELECTRON MICROSCOPY;

EID: 0032623927     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00062-2     Document Type: Article
Times cited : (196)

References (31)
  • 4
    • 0012506664 scopus 로고
    • ed. G. Abbruzzese and P. Brozzo. Trans Tech Publications, Switzerland
    • Smith, D. A., in Grain Growth in Polycrystalline Materials, ed. G. Abbruzzese and P. Brozzo. Trans Tech Publications, Switzerland, 1992, p. 221.
    • (1992) In Grain Growth in Polycrystalline Materials , pp. 221
    • Smith, D.A.1
  • 10
    • 0345211106 scopus 로고    scopus 로고
    • ed. T. McNelley. Monterey, CA
    • Vandermeer, R. A., in Proc. Rex'96, ed. T. McNelley. Monterey, CA, 1997, p. 55.
    • (1997) In Proc. Rex'96 , pp. 55
    • Vandermeer, R.A.1
  • 31
    • 0003052053 scopus 로고
    • ed. D. Wolf and S. Yip. Chapman & Hall, London
    • Palumbo, G. and Aust, K. T., in Materials Interfaces, ed. D. Wolf and S. Yip. Chapman & Hall, London, 1992, p. 190.
    • (1992) In Materials Interfaces , pp. 190
    • Palumbo, G.1    Aust, K.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.