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Materials Science and Technology
Volumn 18, Issue 2, 2002, Pages 119-133
Electron backscatter diffraction and cracking
(1)
Gourgues, Anne Francoise
a
a
PSL RESEARCH UNIVERSITY
(
France
)
Author keywords
[No Author keywords available]
Indexed keywords
CERAMICS; CRYSTALLOGRAPHY; ELECTRON; GEOMETRY; MATERIALS; MECHANICS; REVIEW; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;
EID
:
0036478929
PISSN
:
02670836
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1179/026708301125000320
Document Type
:
Review
Times cited : (
115
)
References (
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