Mapping the mesoscale interface structure in polycrystalline materials

Ultramicroscopy

Volumn 93, Issue 2, 2002, Pages 99-109

  Wu, C T ^a   Adams, B L ^a   Bauer, C L ^a   Casasent, D ^a   Morawiec, A ^a   Ozdemir, S ^a   Talukder, A ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Electron backscatter diffraction patterns; Orientation imaging microscopy; Triple junctions

Indexed keywords

ALGORITHMS; BACKSCATTERING; DIFFRACTION; ELECTRONS; IMAGING TECHNIQUES; MICROSTRUCTURE; SCANNING; SCANNING ELECTRON MICROSCOPY;

MESOSCALE INTERFACE STRUCTURES;

POLYCRYSTALLINE MATERIALS;

CRYSTALLIN;

ACCURACY; ALGORITHM; ANALYTIC METHOD; ARTICLE; AUTOMATION; CALIBRATION; ELECTRON DIFFRACTION; IMAGING SYSTEM; OPTICAL RESOLUTION; QUANTITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL IMAGING; ULTRASTRUCTURE;

EID: 0036837372     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00151-1     Document Type: Article

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