Characterization of bulk superconductors through EBSD methods

Physica C: Superconductivity and its Applications

Volumn 392-396, Issue PART 1, 2003, Pages 545-556

  Koblischka, M R ^a   Koblischka Veneva, A ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

Automated mapping; Bulk high Tc superconductors; Ceramics; Electron backscatter diffraction; SEM

Indexed keywords

BACKSCATTERING; CRYSTALLOGRAPHY; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

AUTOMATED MAPPING;

SUPERCONDUCTING MATERIALS;

EID: 0042283735     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(03)00850-5     Document Type: Conference Paper

References (24)

1. Dingley D.J., Randle V. J. Mater. Sci. 27:1992;4585.
2. Adams B.L., Wright S.I., Kunze K. Metall. Trans. A. 24:1993;819.
3. Kikuchi S. Jpn. J. Phys. 5:1928;23.
4. Schwarzer R.A. Schwartz A.J., Kumar M., Adams B.L. Electron Backscatter Diffraction in Materials Science. 2000;105 Kluwer Academic/Plenum Publishers, New York, Schwarzer R.A. Mat. Sci. Forum. 287-288:1998;23.
5. Schwarzer R.A. Schwartz A.J., Kumar M., Adams B.L. Electron Backscatter Diffraction in Materials Science. 2000;105 Kluwer Academic/Plenum Publishers, New York, Schwarzer R.A. Mat. Sci. Forum. 287-288:1998;23.
6. Goyal A. Schwartz A.J., Kumar M., Adams B.L. Electron Backscatter Diffraction in Materials Science. 2000;319 Kluwer Academic/Plenum Publishers, New York.
7. Rutter N.A., Glowacki B.A., Evetts J.E. Supercond. Sci. Technol. 13:2000;L25.
8. Fairhurst R.J.et al. Physica C. 341-348:2000;2019.
9. T.C. Shields, J.S. Abell, A. Drake, Proceedings of Electron Microscopy and Analysis Group Conference EMAG 95, Birmingham, Institute of Physics Conference Series 147, Section 10, p. 425.
10. Claus J.et al. Mat. Sci. Forum. 157-162:1994;1161.
11. Goyal A.et al. Appl. Phys. Lett. 67:1995;2563.
12. Bramley A.P.et al. J. Supercond. 11:1998;71.
13. Goyal A.et al. Appl. Phys. Lett. 66:1995;2903 Tan T.T.et al. Supercond. Sci. Technol. 14:2001;78.
14. Goyal A.et al. Appl. Phys. Lett. 66:1995;2903 Tan T.T.et al. Supercond. Sci. Technol. 14:2001;78.
15. Orientation Imaging Microscopy software version V2.6, user manual, TSL, Draper, UT.
16. Alarco J.A., Riches J.D., Barry J.C. Physica C. 312:2000;201.
17. Fujimoto T., Mitsuru M., Masahashi N., Kaneko T. IOP Conf. Ser. 167. vol. 1:2000;79.
18. Koblischka-Veneva A.et al. Supercond. Sci. Technol. 15:2002;796.
19. M.R. Koblischka et al., Physica C (2003), these Proceedings.
20. Koblischka-Veneva A.et al. Physica C. 382:2002;311.
21. Veneva A.et al. Physica C. 308:1998;175.
22. Koblischka-Veneva A.et al. Physica C. 357-360:2001;201.
23. Koblischka-Veneva A.et al. Cryst. Eng. 5:2002;265.
24. A. Koblischka-Veneva, M.R. Koblischka, Proceedings of MOS Conference, 13.8.-18.8.2002, Hsinchu, Taiwan, J. Low Temp. Phys., in press.