Increasing shear force microscopy scanning rate using active quality-factor control

Applied Physics Letters

Volumn 82, Issue 17, 2003, Pages 2761-2763

  Antognozzi, M ^a   Szczelkun, M D ^b   Humphris, A D L ^b   Miles, M J ^b  

^a HANNOVER MEDICAL SCHOOL   (Germany)

^b UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; MICA; MICROSCOPIC EXAMINATION; NUCLEIC ACIDS; OPTICAL FIBERS; QUALITY CONTROL; SIGNAL TO NOISE RATIO;

SHEAR FORCE MICROSCOPY;

SCANNING;

EID: 0038297214     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1571233     Document Type: Article

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