-
1
-
-
0012618901
-
Atomic force microscope
-
G. Binnig, C.F. Quate, and C. Gerber, Atomic force microscope. Physical Review Letters, 56(9): p. 930-933, 1986.
-
(1986)
Physical Review Letters
, vol.56
, Issue.9
, pp. 930-933
-
-
Binnig, G.1
Quate, C.F.2
Gerber, C.3
-
2
-
-
36549095714
-
Single-tube three-dimensional scanner for scanning tunneling microscopy
-
G. Binnig and D.P.E. Smith, Single-tube three-dimensional scanner for scanning tunneling microscopy. Review of Scientific Instruments, 57(8, pt.1): p. 1688-1689, 1986.
-
(1986)
Review of Scientific Instruments
, vol.57
, Issue.8 PART 1
, pp. 1688-1689
-
-
Binnig, G.1
Smith, D.P.E.2
-
4
-
-
0142194527
-
Robust identification and control of scanning probe microscope scanner
-
Budapest, Hungary
-
A. Daniele, T. Nakata, L. Giarre, M.V. Salapaka, and M. Dahleh. Robust identification and control of scanning probe microscope scanner. in Robust Control Design. (ROCOND'97). Proceedings Volume from the IFAC Symposium. 25-27 June 1997; Budapest, Hungary, 1997.
-
(1997)
Robust Control Design. (ROCOND'97). Proceedings Volume from the IFAC Symposium 25-27 June 1997
-
-
Daniele, A.1
Nakata, T.2
Giarre, L.3
Salapaka, M.V.4
Dahleh, M.5
-
5
-
-
0040743291
-
Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes
-
R.V. Lapshin and O.V. Obyedkov, Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes. Review of Scientific Instruments, 64(10): p. 2883-2887, 1993.
-
(1993)
Review of Scientific Instruments
, vol.64
, Issue.10
, pp. 2883-2887
-
-
Lapshin, R.V.1
Obyedkov, O.V.2
-
6
-
-
0035419646
-
High performance feedback for fast scanning atomic force microscopes
-
G. Schitter, P. Menold, H.F. Knapp, F. Allgöwer, and A. Stemmer, High performance feedback for fast scanning atomic force microscopes. Review of Scientific Instruments, 72(8): p. 3320-3327, 2001.
-
(2001)
Review of Scientific Instruments
, vol.72
, Issue.8
, pp. 3320-3327
-
-
Schitter, G.1
Menold, P.2
Knapp, H.F.3
Allgöwer, F.4
Stemmer, A.5
-
7
-
-
0028330583
-
N4SID: Subspace algorithms for the identification of combined deterministic-stochastic systems
-
P. Van Overschee and B. De Moor, N4SID: subspace algorithms for the identification of combined deterministic-stochastic systems. Automatica, 30(1): p. 75-93, 1994.
-
(1994)
Automatica
, vol.30
, Issue.1
, pp. 75-93
-
-
Van Overschee, P.1
De Moor, B.2
-
8
-
-
0029509295
-
Subspace-based methods for the identification of linear time-invariant systems
-
M. Viberg, Subspace-based methods for the identification of linear time-invariant systems. Automatica, 31(12): p. 1835-1851, 1995.
-
(1995)
Automatica
, vol.31
, Issue.12
, pp. 1835-1851
-
-
Viberg, M.1
-
9
-
-
0003473124
-
System Identification, Theory for the User, 2nd Ed.
-
ed. T. Kailath. Upper Saddle River, NJ: Prentice Hall
-
L. Ljung, System Identification, Theory for the User, 2nd Ed. PTR Prentice Hall Information and System Sciences Series, ed. T. Kailath. Upper Saddle River, NJ: Prentice Hall, 1999.
-
(1999)
PTR Prentice Hall Information and System Sciences Series
-
-
Ljung, L.1
-
10
-
-
0142225662
-
-
DSP-System: processor board DS1005, 16-bit A/D-board DS2001, 16-bit D/A-board DS2102, dSpace: Germany
-
DSP-System: processor board DS1005, 16-bit A/D-board DS2001, 16-bit D/A-board DS2102, dSpace: Germany.
-
-
-
-
11
-
-
0142225661
-
Digital Control of Dynamic Systems. 3rd Ed.
-
Menlo Park, CA, USA: Addison-Wesley
-
G.F. Franklin, J.D. Powell, and M.L. Workman, Digital Control of Dynamic Systems. 3rd ed. Addison-Wesley Longman Control Engineering. Menlo Park, CA, USA: Addison-Wesley, 1998.
-
(1998)
Addison-Wesley Longman Control Engineering
-
-
Franklin, G.F.1
Powell, J.D.2
Workman, M.L.3
-
12
-
-
0003706925
-
-
Research Triangle Park, NC: Instrument Society of America
-
K.J. Aström and T. Hägglund, PID Controllers: Theory, Design, and Tuning, 2nd Ed. Research Triangle Park, NC: Instrument Society of America, 1995.
-
(1995)
PID Controllers: Theory, Design, and Tuning, 2nd Ed.
-
-
Aström, K.J.1
Hägglund, T.2
-
14
-
-
0037682172
-
Model-based signal conditioning for high-speed atomic force and friction force microscopy
-
in press
-
G. Schitter and A. Stemmer, Model-based signal conditioning for high-speed atomic force and friction force microscopy. Microelectronic Engineering, in press, 2003.
-
(2003)
Microelectronic Engineering
-
-
Schitter, G.1
Stemmer, A.2
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